发明名称 Adaptive Structured Light Patterns
摘要 A method of depth map optimization using an adaptive structured light pattern is provided that includes capturing, by a camera in a structured light imaging device, a first image of a scene into which a pre-determined structured light pattern is projected by a projector in the structured light imaging device, generating a first disparity map based on the captured first image and the structured light pattern, adapting the structured light pattern based on the first disparity map to generate an adaptive pattern, wherein at least one region of the structured light pattern is replaced by a different pattern, capturing, by the camera, a second image of the scene into which the adaptive pattern is projected by the projector, generating a second disparity map based on the captured second image and the adaptive pattern, and generating a depth image using the second disparity map.
申请公布号 US2015022644(A1) 申请公布日期 2015.01.22
申请号 US201414322741 申请日期 2014.07.02
申请人 Texas Instruments Incorporated 发明人 Appia Vikram VijayanBabu
分类号 H04N13/02 主分类号 H04N13/02
代理机构 代理人
主权项 1. A method of image processing in a structured light imaging device, the method comprising: capturing, by a camera in the structured light imaging device, a first image of a scene into which a pre-determined structured light pattern is projected by a projector in the structured light imaging device; generating a first disparity map based on the captured first image and the structured light pattern; adapting the structured light pattern based on the first disparity map to generate an adaptive pattern, wherein at least one region of the structured light pattern is replaced by a different pattern; capturing, by the camera, a second image of the scene into which the adaptive pattern is projected by the projector; generating a second disparity map based on the captured second image and the adaptive pattern; and generating a depth image using the second disparity map.
地址 Dallas TX US