| 主权项 |
1. A test apparatus, including:
a sector conveyance device pivotably mounted by a pivot and formed with a plurality of soaking buffers, said soaking buffers being used to carry a plurality of electronic components, the sector conveyance device being pivoted to a test location or a transferring location by the pivot; a transferring device arranged in correspondence to the transferring location for transferring each of the electronic components into or out of the sector conveyance device; and a test device arranged in correspondence to the test location for testing one electronic component, which is picked up at the test location from the sector conveyance device, of the electronic components, after the one electronic component is tested, the tested one electronic component being placed in the sector conveyance device; wherein, after the one electronic component is tested, during a period in which the test device tests a next electronic component to be tested, the sector conveyance device is pivoted away from the test location to the transferring location so that the tested one electronic component is transferred out of the sector conveyance device by the transferring device and a new electronic component is transferred into the sector conveyance device by the transferring device. |
