TECHNIQUES AND CIRCUITS FOR TESTING A VIRTUAL POWER SUPPLY AT AN INTEGRATED CIRCUIT DEVICE

摘要

A power grid provides power to one or more modules of an integrated circuit device via a virtual power supply signal. A test module is configured to respond to assertion of a test signal so that, when the power grid is working properly and is not power gated, an output of the test module matches the virtual power supply. When the power grid is not working properly, the output of the test module is a fixed logic signal that does not vary based on the power gated state of the one or more modules.

主权项

1. An integrated circuit device comprising:
a first power grid test module, comprising:
a first input to receive a first power grid signal that supplies power to a first functional module;a second input to receive a test enable signal; andan output, wherein when the test enable signal is in an asserted state the first power grid test module is to provide a buffered representation of the first power grid signal at the output in response to the first power grid signal being within defined parameters and to provide a signal having a predefined state at the output in response to the first power grid signal being outside the defined parameters.