NEEDLE BLOCK FOR SEMICONDUCTOR TEST APPARATUS IMPROVING PERFORMANCE IN HIGH FREQUENCY

摘要

The present invention relates to a needle block for a semiconductor test device having improved high frequency performance. The present invention provides the needle block for the semiconductor test device having the improved high frequency performance comprising; a guard body which is formed of a conductive material. One or more insertion holes wherein a ground needle is inserted are formed on one side of the guard body. A plurality of second insertion holes wherein input and output needles are inserted is formed on the other side of the guard body. The needle block comprises a pair of guide plates which is installed on the upper and lower side of the guard body, respectively and supports the ground needle and one side of the input and output needles. The second insertion hole has the diameter larger than the diameter of a signal needle. According to the present invention as above, the guard body of the conductive material surrounding around the ground needle and the input and output needles is formed between guide plates which support the upper and lower sides of the needle, respectively. A loop area of a current has a minimum area and a shielding wall of a conductive material is formed between the input and output needles. Therefore, impedance gets lower and it is prevented in advance that a signal between the input and output needles is interfered mutually and high frequency performance is dramatically improved.