发明名称 SEMICONDUCTOR DEVICE
摘要 <p>PROBLEM TO BE SOLVED: To provide a semiconductor device which can correctly measure temperatures of two semiconductor elements by one temperature sensor.SOLUTION: A semiconductor device comprises: a first switching element Tr1 and a second switching element Tr2, which are arranged opposite to each other across inter-element connection second wiring 14AA, and a source electrode S of the first switching element Tr1 and a drain electrode D of the second switching element Tr2 are electrically connected to the inter-element connection second wiring 14AA; and a thermistor Th is arranged lateral to the second switching element Tr2. The inter-element connection second wiring 14AA has a component hole 14b and the thermistor Th pierces the component hole 14b in a state of not contacting an inner periphery of the component hole 14b at the inter-element connection second wiring 14AA.</p>
申请公布号 JP2015015349(A) 申请公布日期 2015.01.22
申请号 JP20130140747 申请日期 2013.07.04
申请人 JTEKT CORP;DENSO CORP 发明人 NAGASE SHIGEKI;YOSHIDA KAZUTADA;TADA KAZUO
分类号 H01L23/58;H01L25/065;H01L25/07;H01L25/18;H05K3/46 主分类号 H01L23/58
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