| 摘要 |
A device for testing electronic equipment comprising a measuring unit with a connection unit for the input and output of signals to a device under test, and a first processor, and a control unit, spatially separate from the measuring unit, that includes a second processor. The first processor and/or the second processor implement the control of the measurement procedure and the evaluation of the measured signals. The device control unit includes a remote-control unit for the remote control of the measuring unit. |
