发明名称 INSPECTION SYSTEM AND METHOD FOR FAST CHANGES OF FOCUS
摘要 <p>An inspection system includes a first focusing unit configured to perform fast focus changes to a first focusing function applied to an incident light beam. A traveling lens acousto-optic device is arranged to receive the light beam focused by the first focusing function and produce focused spots using a plurality of traveling lenses generated in response to radio frequency signals. The traveling lenses apply a second focusing function and the traveling lens acousto-optic device is arranged to alter the second focusing function at a fast rate. The inspection system also includes optics arranged to direct the focused spots onto an inspected object and to direct radiation from the inspected object to a sensor.</p>
申请公布号 KR101485069(B1) 申请公布日期 2015.01.21
申请号 KR20110100231 申请日期 2011.09.30
申请人 发明人
分类号 H01L21/66;H04N21/00 主分类号 H01L21/66
代理机构 代理人
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