发明名称 RESISTANCE CHANGE MEMORY
摘要 A resistance change memory device with a high ON/OFF ratio can be provided. A resistance change memory device according to an embodiment includes a first electrode containing a first element, a resistance change layer provided on the first electrode and containing an oxide of the first element, an oxygen conductive layer provided on the resistance change layer, containing a second element and oxygen, having oxygen ion conductivity, and having a relative permittivity higher than a relative permittivity of the resistance change layer, and a second electrode provided on the oxygen conductive layer. The resistance change layer undergoes dielectric breakdown earlier than the oxygen conductive layer when a voltage between the first electrode and the second electrode is continuously increased from zero.
申请公布号 EP2827367(A1) 申请公布日期 2015.01.21
申请号 EP20130761116 申请日期 2013.03.12
申请人 TOKYO INSTITUTE OF TECHNOLOGY;TOSHIBA MATERIALS CO., LTD. 发明人 KAKUSHIMA, KUNIYUKI;DOU, CHUNMENG;AHMET, PARHAT;IWAI, HIROSHI;KATAOKA, YOSHINORI
分类号 H01L27/105;H01L45/00;H01L49/00 主分类号 H01L27/105
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