| 摘要 |
A spectrometer includes a light source, an interferometer, an accessory compartment, a sample analysis device, a first and a second optical element, and an actuator. The light source transmits light toward the interferometer which forms modulated light. The accessory compartment accepts a sample analysis accessory device and includes a first wall having a first light port. The sample analysis device performs attenuated total reflectance analysis of a sample and includes a crystal, a tip configured to press the sample against the crystal, and a detector configured to detect light after reflection within the crystal. The first optical element receives and reflects the modulated light toward the first light port. The actuator moves the second optical element between a first position wherein the second optical element receives the modulated light and reflects the modulated light toward the crystal and a second position wherein the second optical element does not receive the modulated light and allows the first optical element to receive the modulated light. |
