发明名称 Sputtering target and manufacturing method thereof, and transistor
摘要 One object is to provide a deposition technique for forming an oxide semiconductor film. By forming an oxide semiconductor film using a sputtering target including a sintered body of a metal oxide whose concentration of hydrogen contained is low, for example, lower than 1×1016 atoms/cm3, the oxide semiconductor film contains a small amount of impurities such as a compound containing hydrogen typified by H2O or a hydrogen atom. In addition, this oxide semiconductor film is used as an active layer of a transistor.
申请公布号 US8937020(B2) 申请公布日期 2015.01.20
申请号 US201313922323 申请日期 2013.06.20
申请人 Semiconductor Energy Laboratory Co., Ltd. 发明人 Yamazaki Shunpei;Takayama Toru;Sato Keiji
分类号 H01L21/302;H01L21/461;C04B41/00;H01L29/786;C04B35/453;C23C14/34;H01L21/02;H01L29/423;C04B35/01;C23C14/56;C04B35/645;C23C14/10;B29C31/00;H01L29/417;H01L29/66;C04B41/80;H01L29/45;C04B111/00 主分类号 H01L21/302
代理机构 Fish & Richardson P.C. 代理人 Fish & Richardson P.C.
主权项 1. A manufacturing method of a sputtering target, comprising: mixing and baking a plurality of metal oxides to form a sintered body; performing a mechanical processing on the sintered body so as to form a target; cleaning the target; and performing a heat treatment on the cleaned target.
地址 Atsugi-shi, Kanagawa-ken JP