发明名称 |
Sputtering target and manufacturing method thereof, and transistor |
摘要 |
One object is to provide a deposition technique for forming an oxide semiconductor film. By forming an oxide semiconductor film using a sputtering target including a sintered body of a metal oxide whose concentration of hydrogen contained is low, for example, lower than 1×1016 atoms/cm3, the oxide semiconductor film contains a small amount of impurities such as a compound containing hydrogen typified by H2O or a hydrogen atom. In addition, this oxide semiconductor film is used as an active layer of a transistor. |
申请公布号 |
US8937020(B2) |
申请公布日期 |
2015.01.20 |
申请号 |
US201313922323 |
申请日期 |
2013.06.20 |
申请人 |
Semiconductor Energy Laboratory Co., Ltd. |
发明人 |
Yamazaki Shunpei;Takayama Toru;Sato Keiji |
分类号 |
H01L21/302;H01L21/461;C04B41/00;H01L29/786;C04B35/453;C23C14/34;H01L21/02;H01L29/423;C04B35/01;C23C14/56;C04B35/645;C23C14/10;B29C31/00;H01L29/417;H01L29/66;C04B41/80;H01L29/45;C04B111/00 |
主分类号 |
H01L21/302 |
代理机构 |
Fish & Richardson P.C. |
代理人 |
Fish & Richardson P.C. |
主权项 |
1. A manufacturing method of a sputtering target, comprising:
mixing and baking a plurality of metal oxides to form a sintered body; performing a mechanical processing on the sintered body so as to form a target; cleaning the target; and performing a heat treatment on the cleaned target. |
地址 |
Atsugi-shi, Kanagawa-ken JP |