发明名称 |
Mutations on input for test generation |
摘要 |
A method, apparatus and product to be used in verification. The method comprising: based on a test generation input that defines a plurality of requirements automatically determining a mutated test generation input, wherein the mutated test generation input defining a mutated requirement which is absent from the test generation input, wherein the mutated requirement is based on a requirement of the plurality of requirements and contradicts, at least in part, the plurality of requirements; and generating one or more test-cases based on the mutated test generation input, whereby the one or more test-cases violate at least one requirement of the test generation input. |
申请公布号 |
US8938646(B2) |
申请公布日期 |
2015.01.20 |
申请号 |
US201213658838 |
申请日期 |
2012.10.24 |
申请人 |
International Business Machines Corporation |
发明人 |
Fournier Laurent;Koyfman Anatoly;Rimon Michal;Ziv Avi |
分类号 |
G06F11/00 |
主分类号 |
G06F11/00 |
代理机构 |
|
代理人 |
Glazberg Ziu |
主权项 |
1. A computer-implemented method performed by a processor, the method comprising:
based on a test generation input that defines a plurality of requirements automatically determining a mutated test generation input, wherein the mutated test generation input defining a mutated requirement which is absent from the test generation input, wherein the mutated requirement is based on a requirement of the plurality of requirements and contradicts, at least in part, the plurality of requirements, wherein the test generation input is a test template, and wherein the mutated test generation input is a mutated test template, wherein said automatically comprises performing a mutation on a requirement of the plurality of requirements to determine the mutated requirement, wherein the mutation is selected from a mutation of the group consisting of:
a mutation on a control flow requirement defined by the test template;a mutation on a required instruction by the test template; anda mutation on micro-architectural mechanism defined by the test template; and generating one or more test-cases based on the mutated test generation input, whereby the one or more test-cases violate at least one requirement of the test generation input. |
地址 |
Armonk NY US |