发明名称 Mutations on input for test generation
摘要 A method, apparatus and product to be used in verification. The method comprising: based on a test generation input that defines a plurality of requirements automatically determining a mutated test generation input, wherein the mutated test generation input defining a mutated requirement which is absent from the test generation input, wherein the mutated requirement is based on a requirement of the plurality of requirements and contradicts, at least in part, the plurality of requirements; and generating one or more test-cases based on the mutated test generation input, whereby the one or more test-cases violate at least one requirement of the test generation input.
申请公布号 US8938646(B2) 申请公布日期 2015.01.20
申请号 US201213658838 申请日期 2012.10.24
申请人 International Business Machines Corporation 发明人 Fournier Laurent;Koyfman Anatoly;Rimon Michal;Ziv Avi
分类号 G06F11/00 主分类号 G06F11/00
代理机构 代理人 Glazberg Ziu
主权项 1. A computer-implemented method performed by a processor, the method comprising: based on a test generation input that defines a plurality of requirements automatically determining a mutated test generation input, wherein the mutated test generation input defining a mutated requirement which is absent from the test generation input, wherein the mutated requirement is based on a requirement of the plurality of requirements and contradicts, at least in part, the plurality of requirements, wherein the test generation input is a test template, and wherein the mutated test generation input is a mutated test template, wherein said automatically comprises performing a mutation on a requirement of the plurality of requirements to determine the mutated requirement, wherein the mutation is selected from a mutation of the group consisting of: a mutation on a control flow requirement defined by the test template;a mutation on a required instruction by the test template; anda mutation on micro-architectural mechanism defined by the test template; and generating one or more test-cases based on the mutated test generation input, whereby the one or more test-cases violate at least one requirement of the test generation input.
地址 Armonk NY US