| 发明名称 | Complex index refraction tomography with sub λ/6-resolution | ||
| 摘要 | A method for imaging a microscopic object with improved resolution including the steps of measuring a complex wavefield scattered by the microscopic object with an instrument or microscope, the complex wavefield being represented by phase and amplitude or by real and imaginary parts; and computing an image of the microscopic object with a resolution better than given by the Abbe diffraction limit, including deconvolving the complex wavefield scattered by the microscopic object with a complex coherent transfer function (CTF) applied to the complex wavefield. | ||
| 申请公布号 | US8937722(B2) | 申请公布日期 | 2015.01.20 |
| 申请号 | US201113637928 | 申请日期 | 2011.03.28 |
| 申请人 | Ecole Polytechnique Federale de Lausanne (EPFL) | 发明人 | Cotte Yann;Pavillon Nicolas;Depeursinge Christian |
| 分类号 | G01B9/021;G02B21/00;G02B21/36 | 主分类号 | G01B9/021 |
| 代理机构 | Nixon & Vanderhye P.C. | 代理人 | Nixon & Vanderhye P.C. |
| 主权项 | 1. A method for imaging a microscopic object with improved resolution comprising: measuring with an interferometer or microscope a complex wavefield scattered by the microscopic object, the complex wavefield being represented by phase and amplitude or by real and imaginary parts; and computing an image of the microscopic object with a resolution better than given by the Abbe diffraction limit, including deconvolving the complex wavefield scattered by the microscopic object with a complex coherent transfer function (CTF) applied to the complex wavefield. | ||
| 地址 | Lausanne CH | ||