| 摘要 |
PROBLEM TO BE SOLVED: To provide a measurement device and a measurement method for an inspected material, allowing suppression of generation of a non-inspection region in nondestructive inspection and allowing suppression of appearance of an excessive overlap inspection region by measuring a feed pitch (a flaw detection pitch), an axial direction speed, or a circumferential direction speed of the inspected material over the full length.SOLUTION: A device measuring a feed pitch or the like for an inspected material 10 carried in an axial direction while rotating the inspected material 10 around an axis in nondestructive inspection includes: an application device 31 applying a paint to the outer circumferential face of the carried inspected material in a dot state at a constant time interval; a camera 32 imaging the outer circumferential face applied with the paint in the dot state of the carried inspected material; detection means detecting coordinates of the paint applied in the dot state from a captured image; correction means correcting the detected coordinates of the dot-like applied paint such that the coordinates indicate a distance in a state that the outer circumferential face of the inspected material is developed to a plane; and calculation means calculating the feed pitch or the like by use of the corrected coordinates of the dot-like applied paint. |
