发明名称 |
METHOD FOR CUTTING MOLD GATE OF RESIN-ENCAPSULATED SEMICONDUCTOR CHIP |
摘要 |
PURPOSE:To reduce notch defects and crack defects of mold due to the stress concentration on the mold by using a method for cutting the mold gate of a semiconductor chip. CONSTITUTION:Tapers 101a and 102a are provided at the leading edges of a flow cavity cut punch 101 and a through gate cut punch 102 to be used for cutting the mold gate of a semiconductor chip. The cross-section of the gate may be a circular arc convex, a trapezoid and a circular arc concave. Thus, the stress concentration on the mold at the time of cutting the gate is reduced and notch defects and crack defects are reduced. |
申请公布号 |
JPH06252184(A) |
申请公布日期 |
1994.09.09 |
申请号 |
JP19930036510 |
申请日期 |
1993.02.25 |
申请人 |
HITACHI LTD;AKITA DENSHI KK |
发明人 |
NEMOTO KATSUMI;KAMATA KIMIHITO |
分类号 |
B26D1/08;B29C45/38;B29L31/34;H01L21/56;H01L23/50;(IPC1-7):H01L21/56 |
主分类号 |
B26D1/08 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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