发明名称 DEFECT CORRECTION METHOD AND DEFECT CORRECTION DEVICE
摘要 <p>PROBLEM TO BE SOLVED: To provide a defect correction method in which, even when film thickness of an electrode is thick and width of the electrode and a space between electrodes are narrow can be stably corrected in a short time.SOLUTION: In this defect correction method, correction liquid 53 is coated at respective ends on disconnection defect part 52 side of electrodes 51a, 51b by using a coating needle 1 whose coating diameter is larger than the width of an electrode 51, and the correction liquid 53 is coated between the ends of the electrodes 51a, 51b by using a coating needle 2 whose coating diameter is the almost same as the width of the electrode 51. A width Wa of the correction liquid 53 at the end (A part) of the electrode 51a, a width Wb of the correction liquid 53 at the end (B part) of the electrode 51b, and a width W of the electrode 51 can be made to have the almost same width.</p>
申请公布号 JP2015012002(A) 申请公布日期 2015.01.19
申请号 JP20130133714 申请日期 2013.06.26
申请人 NTN CORP 发明人 YAMANAKA AKIHIRO;SHIMIZU SHIGEO
分类号 H05K3/22;B05C1/02;B05D1/28;B05D3/02;B05D3/06;B05D7/00;H05K3/10 主分类号 H05K3/22
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