发明名称 Nonvolatile memory device and method for fabricating the same
摘要 <p>PURPOSE: A non-volatile memory device and a manufacturing method thereof are provided to prevent collapsing an inter-layer insulating film in a wet etch process by forming supporters on a contact area. CONSTITUTION: A semiconductor substrate(100) includes a memory cell area(MR) and a contact area(CR). An activity post(PL) is perpendicularly extended about the semiconductor substrate. A first gate electrode is formed on the memory cell area. A second gate electrode is formed on the contact area. A plurality of supporter(SP) passes through the gate electrodes. The supporters support an edge part of the gate electrodes and a laminated inter-layer insulating film(110).</p>
申请公布号 KR101482633(B1) 申请公布日期 2015.01.16
申请号 KR20090049950 申请日期 2009.06.05
申请人 发明人
分类号 H01L21/8247;H01L27/115 主分类号 H01L21/8247
代理机构 代理人
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