| 摘要 |
<p>The present invention relates to an electrical test socket and, more specifically, to an electrical test socket which is arranged between a device to be tested and a testing device for electric connection of a terminal of the device to be tested and a pad of the testing device. The electrical test socket comprises: multiple conductive units which are arranged at locations corresponding to a terminal of a device to be tested, are connected to the terminal of the device to be tested, and have multiple conductive particles arranged in an insulation elastic material along a vertical direction; insulation units which are arranged among the conductive units to insulate the conductive units from one another while supporting the respective conductive units; a conductive unit supporting means including a connection unit which surrounds at least a portion of the upper part of the conductive units and has a portion exposed to the outside, a fixation unit which is spaced apart from the connection unit at the lower side of the connection unit and is fixed to at least either the conductive units or the insulation units; and a link unit to link the connection unit and the fixation unit.</p> |
