发明名称 Apparatus for discriminating defects in top and bottom surfaces of objects
摘要 Apparatus for non-destructive examination of a plate for defects existing in one of both of opposed first and second surfaces thereof includes a rotatable support platform, an eddy current coil structure for inducing eddy currrents in the plate located at a first location in the platform, a first magnetic flux generator disposed at a second location in the platform, the second location being opposite the first location on a line extending from the first location through the platform center. A drive unit rotates the platform relative to the plate.
申请公布号 US5473247(A) 申请公布日期 1995.12.05
申请号 US19930043181 申请日期 1993.04.06
申请人 MAGNETIC ANALYSIS CORPORATION 发明人 YOU, ZHONGGING;BROOKS, ROBERT A.;COLMAN, RICHARD;BEBICK, PAUL J.
分类号 G01N27/82;G01N27/90;(IPC1-7):G01N27/82;G01R33/12 主分类号 G01N27/82
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