发明名称 |
Apparatus for discriminating defects in top and bottom surfaces of objects |
摘要 |
Apparatus for non-destructive examination of a plate for defects existing in one of both of opposed first and second surfaces thereof includes a rotatable support platform, an eddy current coil structure for inducing eddy currrents in the plate located at a first location in the platform, a first magnetic flux generator disposed at a second location in the platform, the second location being opposite the first location on a line extending from the first location through the platform center. A drive unit rotates the platform relative to the plate.
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申请公布号 |
US5473247(A) |
申请公布日期 |
1995.12.05 |
申请号 |
US19930043181 |
申请日期 |
1993.04.06 |
申请人 |
MAGNETIC ANALYSIS CORPORATION |
发明人 |
YOU, ZHONGGING;BROOKS, ROBERT A.;COLMAN, RICHARD;BEBICK, PAUL J. |
分类号 |
G01N27/82;G01N27/90;(IPC1-7):G01N27/82;G01R33/12 |
主分类号 |
G01N27/82 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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