| 发明名称 |
PHOTO DEVICE INSPECTION APPARATUS AND PHOTO DEVICE INSPECTION METHOD |
| 摘要 |
A photo device inspection apparatus is an apparatus for inspecting a solar cell panel, which is a photo device. The photo device inspection apparatus includes an irradiation part configured to irradiate the solar cell panel with pulsed light radiated from a femtosecond laser, which is a light source, an electromagnetic wave detection part configured to detect a pulse of an electromagnetic wave radiated from the solar cell panel in response to irradiation with the pulsed light, and a current detection part configured to detect a current generated by the solar cell panel in response to irradiation with the pulsed light. |
| 申请公布号 |
US2015015297(A1) |
申请公布日期 |
2015.01.15 |
| 申请号 |
US201414327383 |
申请日期 |
2014.07.09 |
| 申请人 |
DAINIPPON SCREEN MFG. CO., LTD. ;OSAKA UNIVERSITY |
发明人 |
Nakanishi Hidetoshi;Ito Akira;Kawayama Iwao;Tonouchi Masayoshi |
| 分类号 |
G01R31/26 |
主分类号 |
G01R31/26 |
| 代理机构 |
|
代理人 |
|
| 主权项 |
1. A photo device inspection apparatus for inspecting a photo device, comprising:
an irradiation part configured to irradiate said photo device with light radiated from a light source; an electromagnetic wave detection part configured to detect an electromagnetic wave radiated from said photo device in response to irradiation with said light; and a current detection part configured to detect a current generated by said photo device in response to irradiation with said light. |
| 地址 |
Kyoto-shi JP |
