发明名称 PATTERNING FINS AND PLANAR AREAS IN SILICON
摘要 A method including for forming a plurality of mandrels, a plurality of sidewall spacers, and a plurality of offset spacers above a hardmask layer, the sidewall spacers being separated by the plurality of mandrels and the plurality of offset spacers in an alternating order, each of the plurality of sidewall spacers being in direct contact with a single offset spacer and a single mandrel, the plurality of mandrels being separated from the plurality of offset spacers by the plurality of sidewall spacers, depositing a fill material above the plurality of mandrels, above the plurality of sidewall spacers, above the plurality of offset spacers, and above the hardmask layer, and removing the plurality of mandrels and the plurality of offset spacers selective to the plurality of sidewall spacers, the fill material, and the hardmask layer.
申请公布号 US2015014772(A1) 申请公布日期 2015.01.15
申请号 US201313939665 申请日期 2013.07.11
申请人 International Business Machines Corporation 发明人 Cheng Kangguo;Ponoth Shom;Pranatharthiharan Balasubramanian;Standaert Theodorus E.;Yamashita Tenko
分类号 H01L21/308;H01L27/06 主分类号 H01L21/308
代理机构 代理人
主权项 1. A method comprising: forming a plurality of mandrels, a plurality of sidewall spacers, and a plurality of offset spacers above a hardmask layer, the sidewall spacers being separated by the plurality of mandrels and the plurality of offset spacers in an alternating order, each of the plurality of sidewall spacers being in direct contact with a single offset spacer and a single mandrel, the plurality of mandrels being separated from the plurality of offset spacers by the plurality of sidewall spacers; depositing a fill material above the plurality of mandrels, above the plurality of sidewall spacers, above the plurality of offset spacers, and above the hardmask layer; and removing the plurality of mandrels and the plurality of offset spacers selective to the plurality of sidewall spacers, the fill material, and the hardmask layer.
地址 Armonk NY US