SIGNAL PATH SWITCH AND PROBE CARD HAVING THE SIGNAL PATH SWITCH

摘要

A probe card, which is between a tester and a device under test (DUT), includes two first electrical lines, two second electrical lines, two inductive elements, and a capacitor. The first electrical lines are electrically connected to the probes respectively. The second first electrical lines are electrically connected to the first electrical lines respectively. The inductive elements are electrically connected the first electrical lines and the tester respectively; and the capacitor has opposite ends connected to the second first electrical lines respectively.

主权项

1. A signal path switch, which is provided between a tester and two probes, comprising:
two first electrical lines electrically connected to the probes respectively; two second first electrical lines electrically connected to the first electrical lines respectively; two inductive elements, each of which is electrically connected each of the first electrical lines and the tester respectively; and a capacitor having opposite ends electrically connected to the second first electrical lines respectively.