摘要 |
PROBLEM TO BE SOLVED: To provide a method for improving resolution of a microscope when detecting an illuminated sample, and a microscope for implementing the method.SOLUTION: At a first position, an illumination pattern (I) is formed on a sample (P), desirably, with resolution near or equal to or above optical resolution which can be nearly attained by a microscope, and relative displacement of an illumination pattern from a first position to at least one second position is performed on the sample at a step smaller than a resolution limit of the microscope, advantageously, perpendicularly to an illumination direction between detection and the illumination pattern (I) at least once. The detection and storage of a detection signal are performed not only at the first position but also at the second position. |