| 摘要 |
PROBLEM TO BE SOLVED: To provide a non-contact inspection apparatus which simply inspects a form abnormality of an inspection object in a short time with high accuracy. ! SOLUTION: A non-contact inspection apparatus comprises: a support unit for supporting an inspection object having a columnar or cylindrical portion as an inspection portion; a sensor unit comprising a pair of light-projecting section and light-receiving section that are disposed to face each other across the inspection portion, on a side of a side surface of the inspection portion of the inspection object supported by the support unit; and a rotation mechanism for rotating the sensor unit on a perpendicular plane orthogonal to a central axis of the inspection portion with the central axis being as a rotational center. The rotation mechanism comprises: an annular rotation section that directly or indirectly supports the sensor unit, and that has an outer periphery of a sharp-pointed part with a reverse-V shape extending outward; a rotati |
