PROBE MODULE SUPPORTING LOOPBACK TEST

摘要

A probe module, which supports loopback test and is provided between a PCB and a DUT, includes a substrate, a probe base, two probes, two signal path switchers, and a capacitor. The substrate has two first connecting circuits and two second connecting circuits, wherein an end of each first connecting circuit is connected to the PCB. The probe base is provided between the substrate and the DUT with the probes provided thereon, wherein an end of each probe is exposed and electrically connected to one second connecting circuit, while another end thereof is also exposed to contact the DUT. Each signal path switcher is provided on the probe base, and respectively electrically connected to another end of one first and one second connecting circuits. The capacitor is provided on the probe base with two ends electrically connected to the two signal path switchers.

主权项

1. A probe module, which is provided between a printed circuit board (PCB) and a device-under-test (DUT) to perform a loopback test, comprising:
a substrate having two first connecting circuits and two second connecting circuits, wherein an end of each of the first connecting circuits is electrically connected to the PCB; a probe base provided between the substrate and the DUT; two probes embedded in the probe base, wherein each of the probes has two opposite ends exposed outside of the probe base to be connected to an end of one of the second connecting circuits and to contact a tested pad of the DUT respectively; two signal path switchers provided on the probe base, wherein each of the signal path switchers is electrically connected to another ends of one of the first connecting circuits and one of the second connecting circuits; and a capacitor provided on the probe base, wherein two ends of the capacitor are respectively electrically connected to the signal path switchers.