发明名称 EPITAXIAL WAFER, METHOD OF MANUFACTURING THE SAME, LIGHT RECEIVING ELEMENT, AND OPTICAL SENSOR DEVICE
摘要 PROBLEM TO BE SOLVED: To provide an epitaxial wafer including a multiple quantum well capable of obtaining high crystallinity in the actual production and also to provide a method of manufacturing the same or the like.SOLUTION: On a substrate, a step is provided in which an epitaxial laminate including a multiple quantum well and a surface layer are grown by metal organic chemical vapor deposition method. In a step for growing the epitaxial laminate on the substrate, a lattice mismatch degree &Dgr;ω to the substrate of the multiple quantum well is deviated from zero regarding the center of a range, and the half width of an X-ray locking curve (FWHM) in a zero-order diffraction peak derived from the multiple quantum well is made to be 30 second or less.
申请公布号 JP2015008277(A) 申请公布日期 2015.01.15
申请号 JP20140091371 申请日期 2014.04.25
申请人 SUMITOMO ELECTRIC IND LTD 发明人 FUJII KEI;SHIBATA KAORU;AKITA KATSUSHI
分类号 H01L31/10;H01L21/20;H01L21/205;H01L27/146;H01L29/06 主分类号 H01L31/10
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