发明名称 |
EPITAXIAL WAFER, METHOD OF MANUFACTURING THE SAME, LIGHT RECEIVING ELEMENT, AND OPTICAL SENSOR DEVICE |
摘要 |
PROBLEM TO BE SOLVED: To provide an epitaxial wafer including a multiple quantum well capable of obtaining high crystallinity in the actual production and also to provide a method of manufacturing the same or the like.SOLUTION: On a substrate, a step is provided in which an epitaxial laminate including a multiple quantum well and a surface layer are grown by metal organic chemical vapor deposition method. In a step for growing the epitaxial laminate on the substrate, a lattice mismatch degree &Dgr;ω to the substrate of the multiple quantum well is deviated from zero regarding the center of a range, and the half width of an X-ray locking curve (FWHM) in a zero-order diffraction peak derived from the multiple quantum well is made to be 30 second or less. |
申请公布号 |
JP2015008277(A) |
申请公布日期 |
2015.01.15 |
申请号 |
JP20140091371 |
申请日期 |
2014.04.25 |
申请人 |
SUMITOMO ELECTRIC IND LTD |
发明人 |
FUJII KEI;SHIBATA KAORU;AKITA KATSUSHI |
分类号 |
H01L31/10;H01L21/20;H01L21/205;H01L27/146;H01L29/06 |
主分类号 |
H01L31/10 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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