发明名称 METHOD AND APPARATUS FOR POWER GLITCH DETECTION IN INTEGRATED CIRCUITS
摘要 A method and apparatus for power glitch detection in ICs is disclosed. In one embodiment, a method includes a detection circuit in an IC detecting a voltage transient wherein a value of a supply voltage has at least momentarily fallen below a reference voltage value. Responsive thereto, the detection circuit may cause a logic value to be stored in a register indicating that the detection circuit has detected the supply voltage falling below the reference voltage. The IC may include a number of detection circuits coupled to the register, each of which may provide a corresponding indication of detecting the supply voltage falling below the reference voltage. The detection circuits may be placed at different locations, and thus reading the register may yield information indicating the locations where, if any, such voltage transients occurred.
申请公布号 WO2015006036(A1) 申请公布日期 2015.01.15
申请号 WO2014US43584 申请日期 2014.06.23
申请人 APPLE INC. 发明人 PARK, BRIAN S.;MCNAMARA, PATRICK D.;LEE, KWANG M.;CHONG, MENG C.;JOORDENS, GEERTJAN;THIARA, RAMAN S.;HOANG, ANH T.;GONZALEZ, JOHN P.
分类号 G01R19/165;G01R31/30;G06F1/28;G06F11/28;H02H3/24 主分类号 G01R19/165
代理机构 代理人
主权项
地址