发明名称 窒化物半導体装置
摘要 <p>According to one embodiment, a nitride semiconductor device includes semiconductor stacked layers provided on a substrate and including a nitride semiconductor; a source electrode and a drain electrode provided on the layers and being in contact with the layers; and a gate electrode provided on the layers and provided between the source electrode and the drain electrode. The layers have a first barrier layer, a second barrier layer, and a carrier running layer interposed between the first barrier layer and the second barrier layer. The second barrier layer and the carrier running layer are removed in a region in which the source electrode on the layers is provided. A part of the source electrode is in contact with the first barrier layer. And another part of the source electrode other than the part of the source electrode is in contact with the second barrier layer.</p>
申请公布号 JP5654512(B2) 申请公布日期 2015.01.14
申请号 JP20120069988 申请日期 2012.03.26
申请人 发明人
分类号 H01L21/338;H01L21/28;H01L21/336;H01L29/41;H01L29/417;H01L29/778;H01L29/78;H01L29/812 主分类号 H01L21/338
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