| 摘要 |
<p>The present invention relates to a semiconductor device having a built-in self-test (BIST) function, capable of alternately carrying out a normal mode which is operated to allow two functional blocks performing the same circuit function to perform an original circuit function, and a test mode which is operated for a self-test so a sufficient diagnosis or test can be performed constantly or in a predetermined interval while the device is operated, thereby surely detecting defects in a product.</p> |
