发明名称 パターン形成方法、感活性光線性又は感放射線性樹脂組成物、レジスト膜、電子デバイスの製造方法、及び、電子デバイス
摘要 The present invention relates to a pattern forming method comprising: (1) forming a film by using an actinic ray-sensitive or radiation-sensitive resin composition containing a resin (P) of which the polarity increases by the action of an acid and thereby the solubility in a developer containing an organic solvent decreases and a compound (B) which generates an acid which is represented by the following general formula (I) by irradiation with actinic rays or radiation; (2) exposing the film; and (3) forming a negative-type pattern by developing with a developer which contains an organic solvent, the actinic ray-sensitive or radiation-sensitive resin composition and the resist film which are used in the method, a method for preparing an electronic device and the electronic device.
申请公布号 JP5651636(B2) 申请公布日期 2015.01.14
申请号 JP20120135121 申请日期 2012.06.14
申请人 富士フイルム株式会社 发明人 山口 修平
分类号 G03F7/004;G03F7/038;G03F7/039;G03F7/32;H01L21/027 主分类号 G03F7/004
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