发明名称 |
COMPOSITE MATERIAL FOR SEMICONDUCTOR HEAT SINK AND ITS PRODUCTION |
摘要 |
<p>PROBLEM TO BE SOLVED: To obtain characteristics adapted to the balance between the thermal expansion coefficient and thermal conductivity determined in an actual electronic part (including a semiconductor device), etc. SOLUTION: A high-pressure vessel is kept in the initial state (S1) and the first chamber is then located in the lower part. Copper or a copper alloy is further placed in the first chamber and SiC is set in the second chamber (S2). The high-pressure vessel is subsequently hermetically sealed and evacuation in the interior of the high- pressure vessel is then carried out through a suction pipe (S3). A heater is subsequently energized to thermally melt the copper or copper alloy in the first chamber (S4). The high-pressure vessel is turned 180 deg. at the stage in which the molten copper in the first chamber attains a prescribed temperature (S5) to afford a state of the SiC dipped in the molten copper (S6). A gas for impregnation is then introduced through a gas introduction pipe into the high-pressure vessel to pressurize the interior of the high-pressure vessel. Thereby, the molten copper is impregnated into the SiC. The high-pressure vessel is subsequently turned 180 deg. (S7) and the gas for impregnation in the high-pressure vessel is then discharged through a gas lead-out pipe. A gas for cooling is simultaneously introduced through the gas introduction pipe into the high- pressure vessel to cool the high-pressure vessel (S8).</p> |
申请公布号 |
JPH1129379(A) |
申请公布日期 |
1999.02.02 |
申请号 |
JP19970359101 |
申请日期 |
1997.12.26 |
申请人 |
NGK INSULATORS LTD |
发明人 |
ISHIKAWA SHUHEI;MITSUI TAKASHI |
分类号 |
C04B41/88;C04B41/51;C04B41/52;C22C1/10;C22C9/00;H01L21/48;H01L23/373;(IPC1-7):C04B41/88 |
主分类号 |
C04B41/88 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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