| 摘要 |
<p>PROBLEM TO BE SOLVED: To provide an address generating device and a method for a dynamic memory test circuit generating simply an address for testing a dynamic memory which uses all usable addresses or which does not use a high-order address or an intermediate address among all usable addresses. SOLUTION: An up-address is obtained by up-counting an address used by a dynamic memory, a down-counted down-address is obtained by reversing a counted value of N bits, a down-address is obtained by subtracting a counted value of N bits from the maximum address, and a down-address is obtained by synthesizing a bit in which MSB is reversed from a counted value of N bits and a bit in which LSB of a counted value of N bits is subtracted from LSB of the maximum address used from a dynamic memory. And an address for testing selectively a dynamic memory is generated in accordance with a step at which a down-address, an up-address, and a dynamic memory are tested.</p> |
