| 摘要 |
PROBLEM TO BE SOLVED: To provide an IC test system capable of efficiently making use of an IC test device. SOLUTION: In IC test stations A-C constituted of handlers 11 carrying IC and IC test device main bodies 10 testing operation of IC connected to test heads carried by the handlers 11, the respective handlers 11 transfer the tested IC from test trays to widely used trays without classifying into excellent articles and rejected articles by the respective handlers 11. The tested results of the respective IC are stored in a housing information memory means 14 corresponding to the positions on the respective widely used trays, so that the housing information stored in this housing information memory means 14 can be utilized for a device except the handlers. |
