发明名称 半導体メモリ装置
摘要 <p>To provide a semiconductor memory device storing data, in which a transistor whose leakage current between a source/drain in off state is small is used as a writing transistor. In a matrix of a memory unit formed of two memory cells, in each of which a drain of a writing transistor is connected to a gate of a reading transistor and one electrode of a capacitor, a gate of the writing transistor, and the other electrode of the capacitor in a first memory cell are connected to a first word line, and a second word line, respectively. In a second memory cell, a gate of the writing transistor, and the other electrode of the capacitor are connected to the second word line, and the first word line, respectively. Further, to increase the degree of integration, gates of the reading transistors of memory cells are disposed in a staggered configuration.</p>
申请公布号 JP5651524(B2) 申请公布日期 2015.01.14
申请号 JP20110097724 申请日期 2011.04.26
申请人 发明人
分类号 H01L21/8242;G11C11/405;H01L21/336;H01L21/8247;H01L27/108;H01L27/115;H01L29/786;H01L29/788;H01L29/792 主分类号 H01L21/8242
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