| 摘要 |
<p>A system (100) for detecting the profile of an object. The system (100) comprises a radiation source (101) for generating a radiation pattern. The system (100) also comprises a detector (102) which has a plurality of pixels and a processor (103) for processing data from the detector (102) when radiation from the radiation source is reflected by an object and detected by the detector (102). The system also comprises a synchronization means (104) interfacing between the detector (102) and the radiation source (101). The radiation source (101) is designed for operating in pulsed mode and the synchronization means (104) can synchronize the pulses of the radiation source (101) with the sampling of the detector (102).</p> |
