发明名称 SCANNING SPEED DETERMINING APPARATUS OF SCANNING PROBE MICROSCOPE
摘要 PROBLEM TO BE SOLVED: To provide a subject scanning speed determining apparatus capable of automatically setting the optimum scanning speed corresponding to the surface shape of a sample. SOLUTION: When preparatory scanning is started at a preparatory scanning speed Vp, a sampling part 303 samples the differential signal S2 outputted from a differential amplifier 12 at a predetermined cycle and a power spectrum converting part 304 calculates a power spectrum F showing the relation between the amplitude A of the surface of a sample and the spatial frequency S thereof on the basis of the sampling result. The frequency response characteristic G inherent to a scanner 1 is preliminarily stored in a frequency response characteristic memory part 305. A scanning speed determining part 306 compares the power spectrum F with the frequency response characteristic G to determine a scanning speed V on the basis of the comparison result.
申请公布号 JP2000356580(A) 申请公布日期 2000.12.26
申请号 JP19990165525 申请日期 1999.06.11
申请人 SEIKO INSTRUMENTS INC 发明人 UMEKI TAKESHI
分类号 G01N37/00;G01Q10/04;(IPC1-7):G01N13/10 主分类号 G01N37/00
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