| 发明名称 | Systems and methods for sample analysis | ||
| 摘要 | The invention generally relates to systems and methods for sample analysis. In certain embodiments, the invention provides a system for analyzing a sample that includes a probe including a material connected to a high voltage source, a device for generating a heated gas, and a mass analyzer. | ||
| 申请公布号 | US8932875(B2) | 申请公布日期 | 2015.01.13 |
| 申请号 | US201113977758 | 申请日期 | 2011.12.29 |
| 申请人 | Purdue Research Foundation | 发明人 | Cooks Robert Graham;Li Guangtao;Li Xin;Ouyang Zheng |
| 分类号 | G01N33/28;H01J49/26;H01J49/42;H01J49/04 | 主分类号 | G01N33/28 |
| 代理机构 | Brown Rudnick LLP | 代理人 | Brown Rudnick LLP ;Schoen Adam M. |
| 主权项 | 1. A system for analyzing a sample, the system comprising: a probe comprising a substrate that tapers to a tip, wherein the substrate is configured to hold a sample and the substrate is connected to a high voltage source for generating a voltage; a heating device for generating a heated gas; and a mass spectrometer that comprises a mass analyzer, wherein the system is configured such that the voltage generated from the high voltage source and the heated gas generated from the heating device are simultaneously applied to the substrate in order to desorb and ionize a sample from the substrate and an inlet of the mass spectrometer is operably associated with the substrate to receive ions of the sample. | ||
| 地址 | West Lafayette IN US | ||