发明名称 Semiconductor structure and method for forming the semiconductor structure
摘要 The invention discloses a semiconductor structure comprising: a substrate, a conductor layer, and a dielectric layer surrounding the conductor layer on the substrate; a first insulating layer covering both of the conductor layer and the dielectric layer; a gate conductor layer formed on the first insulating layer, and a dielectric layer surrounding the gate conductor layer; and a second insulating layer covering both of the gate conductor layer and the dielectric layer surrounding the gate conductor layer; wherein a through hole filled with a semiconductor material penetrates through the gate conductor layer perpendicularly, the bottom of the through hole stops on the conductor layer, and a first conductor plug serving as a drain/source electrode is provided on the top of the through hole; and a second conductor plug serving as a source/drain electrode electrically contacts the conductor layer, and a third conductor plug serving as a gate electrode electrically contacts the gate conductor layer.
申请公布号 US8933504(B2) 申请公布日期 2015.01.13
申请号 US201113807010 申请日期 2011.11.30
申请人 发明人 Liang Qingqing;Zhong Huicai;Zhu Huilong
分类号 H01L29/78;H01L21/265;H01L29/66;H01L29/45;H01L29/49;H01L29/786;H01L21/822;H01L21/84;H01L27/06;H01L27/12;H01L27/115;H01L21/28 主分类号 H01L29/78
代理机构 Treasure IP Group 代理人 Treasure IP Group
主权项 1. A stacked semiconductor structure, wherein the stacked semiconductor structure comprises at least two stacked layers of semiconductor structures, each of the semiconductor structures comprising: a substrate, a conductor layer, and a dielectric layer surrounding the conductor layer on the substrate; a first insulating layer covering both of the conductor layer and the dielectric layer; a gate conductor layer formed on the first insulating layer, and a dielectric layer surrounding the gate conductor layer; and a second insulating layer covering both of the gate conductor layer and the dielectric layer surrounding the gate conductor layer; wherein a through hole filled with a semiconductor material penetrates through the gate conductor layer perpendicularly, the bottom of the through hole stops on the conductor layer, and a first conductor plug serving as a drain/source electrode is provided on the top of the through hole; and a second conductor plug serving as a source/drain electrode electrically contacts the conductor layer, and a third conductor plug serving as a gate electrode electrically contacts the gate conductor layer; wherein the second conductor plug serving as a source/drain electrode and provided on the top of the through hole in the lower semiconductor structure electrically contacts the conductor layer of the upper semiconductor structure in two neighborin layers of the semiconductor structures, and other conductor plugs extend upward to the top of the stacked semiconductor structure in mutually different positions.
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