| 主权项 |
1. An arrangement configured to analyze an object by measuring at least two properties of said object, said arrangement comprising:
an infrared system configured to measure at least one thermal property of said object, and a measuring device configured to measure at least one physical property of said object, said physical property being represented by an electrical signal, wherein, said arrangement further comprises a synchronizing system that is arranged to synchronize an operation of said infrared system and said measuring device in such a way that said measuring device and said infrared system each perform a measurement of a property of said object at a time determined by said synchronizing system, wherein one of the infrared system and the measuring device is configured to operate as a master unit and the other of the infrared system and the measuring device is configured to operate as a slave unit, and wherein the master unit controls the measurements performed by the slave unit through the synchronizing system. |
