| 摘要 |
<p>Disclosed is a method for producing a TEM specimen comprising a mounting step for fixing a specimen to a Pyrex and mounting the specimen on a tripod polisher; a basic processing step for processing one side of the specimen to be sloped; a fixing step for attaching a dummy TEM grid to one side of the specimen and fixing the dummy TEM grid to the Pyrex to make the other side of the specimen face the outside; a main processing step for processing the other side of the specimen to be sloped by adjusting the angle of the tripod polisher; and a removing step for attaching an actual TEM grid to the other side of the specimen and removing the dummy TEM grid.</p> |
