发明名称 X-RAY INSPECTION METHOD AND X-RAY INSPECTION DEVICE
摘要 An X-ray inspection method which is capable of measuring a shape of an inspection object at a high speed in a non-destructive manner is provided. The X-ray inspection method includes: a simulation image generating process of generating simulation images of a plurality of transmission images having different shape parameters of an inspection object; an X-ray imaging process of capturing an X-ray transmission image transmitting the inspection object; and a shape estimating process of estimating a shape parameter of a simulation image whose evaluation value indicating a similarity with the X-ray transmission image satisfies predetermined conditions among the plurality of simulation images, as a shape of the inspection object.
申请公布号 KR20150003783(A) 申请公布日期 2015.01.09
申请号 KR20147030762 申请日期 2013.04.24
申请人 TOKYO ELECTRON LIMITED 发明人 UMEHARA YASUTOSHI
分类号 G01B15/04;G01B11/06;G01N23/04;G02B21/00;G06T1/00 主分类号 G01B15/04
代理机构 代理人
主权项
地址
您可能感兴趣的专利