发明名称 TRANSFER MASK BLANK, TRANSFER MASK AND METHOD FOR EXPOSURE
摘要 <p>PROBLEM TO BE SOLVED: To provide a transfer mask blank and a transfer blank capable of easily setting a stress of a silicon membrane to a suitable value and easily suppressing a warp of a pattern or a deformation of a pattern. SOLUTION: The transfer mask blank comprises a supporting base having a strut, the silicon membrane formed with the pattern, and a silicon oxide layer provided between the base and the membrane. In this blank, a mean value of a phosphorus concentration in the membrane is in a range of 5×10<18> to 1×10<20> atoms/cm<3> , and uniformity of the phosphorus concentration in the membrane is within 20% or less.</p>
申请公布号 JP2002261003(A) 申请公布日期 2002.09.13
申请号 JP20010393038 申请日期 2001.12.26
申请人 NIKON CORP 发明人 TAKAHASHI SHINICHI
分类号 G03F1/20;G03F7/20;H01J37/09;H01J37/305;H01L21/027;(IPC1-7):H01L21/027;G03F1/16 主分类号 G03F1/20
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