发明名称 |
DOUBLE PATTERNING TECHNOLOGY (DPT) LAYOUT ROUTING |
摘要 |
One or more techniques or systems for determining double patterning technology (DPT) layout routing compliance are provided herein. For example, a layout routing component of a system is configured to assign a pin loop value to a pin loop. In some embodiments, the pin loop value is assigned based on a mask assignment of a pin of the pin loop. In some embodiments, the pin loop value is assigned based on a number of nodes associated with the pin loop. DPT compliance or a DPT violation is determined for the pin loop based on the pin loop value. In this manner, odd loop detection associated with DPT layout routing is provided because a DPT violation results in generation of an additional instance of a net, for example. Detecting an odd loop allows a design to be redesigned before fabrication, where the odd loop would present undesired issues. |
申请公布号 |
US2015012895(A1) |
申请公布日期 |
2015.01.08 |
申请号 |
US201414496053 |
申请日期 |
2014.09.25 |
申请人 |
Taiwan Semiconductor Manufacturing Company Limited |
发明人 |
Chen Huang-Yu;Fan Fang-Yu;Hou Yuan-Te;Chen Wen-Hao;Wang Chung-Hsing;Cheng Yi-Kan |
分类号 |
G06F17/50 |
主分类号 |
G06F17/50 |
代理机构 |
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代理人 |
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主权项 |
1. A system for determining double patterning technology (DPT) layout routing compliance, comprising:
a layout routing component configured to:
create a first pin group comprising a first set of one or more pre-colored pins that are linked together by a first set of internal conflict spaces;associate the first pin group with a first phantom assisted feature (AF) mask polygon, the associating comprising:
selecting a first pre-colored pin from the first set of one or more pre-colored pins;determining a first mask assignment associated with the first pre-colored pin; andassigning the first phantom AF mask polygon to a different mask than a mask for the first pre-colored pin according to the first mask assignment;create a pin loop based on the first pre-colored pin and the phantom AF mask polygon;assign a pin loop value to the pin loop; anddetermine whether a double patterning technology (DPT) violation is present for the pin loop based on the pin loop value. |
地址 |
Hsin-Chu TW |