WRITE OPERATIONS FOR DEFECT MANAGEMENT IN NONVOLATILE MEMORY

摘要

Data that is stored in a higher error rate format in a nonvolatile memory is backed up in a lower error rate format. Data to be stored may be transferred once to on-chip data latches where it is maintained while it is programmed in both the high error rate format and the low error rate format without being resent to the nonvolatile memory. Storage to a block in the high error rate format may be suspended to allow read out of a previously written high error rate block for error checking (post-write read).