发明名称 RADIATION IMAGE DETECTION DEVICE AND RADIATION IMAGING SYSTEM
摘要 A radiation imaging system comprises a radiation source and a radiation image detection device. The radiation image detection device has a solid state detector and a wavelength converting layer arranged in this order from a radiation-incident side. The wavelength converting layer detects radiation passed through the solid state detector and converts the radiation into visible light. The solid state detector detects the visible light and produces image data. The wavelength converting layer is a phosphor layer, being a single layer, in which at least first phosphor particles having a first average particle diameter and second phosphor particles having a second average particle diameter are dispersed in a binder. The second average particle diameter is smaller than the first average particle diameter. The weight of the first phosphor particles per unit thickness of the wavelength converting layer decreases with increasing distance from the solid state detector.
申请公布号 US2015010130(A1) 申请公布日期 2015.01.08
申请号 US201414335260 申请日期 2014.07.18
申请人 FUJIFILM Corporation 发明人 NAKATSUGAWA Haruyasu;SHIROZU Go
分类号 G01T1/20;A61B6/00 主分类号 G01T1/20
代理机构 代理人
主权项 1. A radiation image detection device comprising: a wavelength converting layer for converting radiation into light, the wavelength converting layer being a single phosphor layer in which at least first phosphor particles and second phosphor particles are dispersed in a binder, the first phosphor particles having a first average particle diameter, the second phosphor particles having a second average particle diameter smaller than the first average particle diameter; and a solid state detector for detecting the light and thereby generating image data, the solid state detector and the wavelength converting layer being disposed in this order from a radiation-incident side on which the radiation from a radiation source is incident at the time of imaging; wherein, a weight of the first phosphor particles per unit thickness of the wavelength converting layer decreases with increasing distance from the solid state detector.
地址 Tokyo JP