发明名称 |
ABNORMALITY DETECTION DEVICE |
摘要 |
An abnormality detection device includes a temperature detection unit that has a resistor section which varies a resistance value depending on a temperature, a resistance detection unit that detects a resistance value of the resistor section, and a short-circuit unit that short-circuits the resistor section, in which the short-circuit unit short-circuits the resistor section when a predetermined abnormality occurs in a detection target of the temperature detection unit. |
申请公布号 |
US2015009595(A1) |
申请公布日期 |
2015.01.08 |
申请号 |
US201414314154 |
申请日期 |
2014.06.25 |
申请人 |
HONDA MOTOR CO., LTD. |
发明人 |
Nishina Masatoshi;Iwamoto Kazuya;Takahashi Yusuke |
分类号 |
H02H9/04 |
主分类号 |
H02H9/04 |
代理机构 |
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代理人 |
|
主权项 |
1. An abnormality detection device comprising:
a temperature detection unit that includes a resistor section which varies a resistance value depending on a temperature; a resistance detection unit configured to detect a resistance value of the resistor section; and a short-circuit unit configured to short-circuit the resistor section, wherein the short-circuit unit short-circuits the resistor section when a predetermined abnormality occurs in a detection target of the temperature detection unit. |
地址 |
Tokyo JP |