发明名称 |
METHOD AND APPARATUS FOR MEASURING MAGNETIC FIELD |
摘要 |
A magnetic field measuring method in a magnetic resonance imaging (MRI) apparatus includes applying a radio frequency (RF) pulse to an object, acquiring first and second echo signals from a first readout gradient according to test gradients having different intensities, acquiring third and fourth echo signals from a second readout gradient according to the test gradients having different intensities, and determining a characteristic value of an eddy field based on an echo time (TE) of at least one of the first through the fourth echo signals. |
申请公布号 |
US2015008921(A1) |
申请公布日期 |
2015.01.08 |
申请号 |
US201414325739 |
申请日期 |
2014.07.08 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
LEE Dae-ho;ZHO Sang-young;KIM Joon-soo |
分类号 |
G01R33/387 |
主分类号 |
G01R33/387 |
代理机构 |
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代理人 |
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主权项 |
1. A magnetic resonance imaging (MRI) apparatus for measuring a magnetic field, the MRI apparatus comprising:
a radio frequency (RF) transmitter configured to apply an RF pulse to an object; a gradient amplifier configured to apply test gradients having different intensities; an RF receiver configured to acquire a first echo signal and a second echo signal from a first readout gradient and acquire a third echo signal and a fourth echo signal from a second readout gradient, according to the test gradients; and an eddy current compensation processor configured to determine a characteristic value of an eddy field based on an echo time (TE) of at least one of the first through the fourth echo signals. |
地址 |
Suwon-si KR |