发明名称 METHOD AND APPARATUS FOR MEASURING MAGNETIC FIELD
摘要 A magnetic field measuring method in a magnetic resonance imaging (MRI) apparatus includes applying a radio frequency (RF) pulse to an object, acquiring first and second echo signals from a first readout gradient according to test gradients having different intensities, acquiring third and fourth echo signals from a second readout gradient according to the test gradients having different intensities, and determining a characteristic value of an eddy field based on an echo time (TE) of at least one of the first through the fourth echo signals.
申请公布号 US2015008921(A1) 申请公布日期 2015.01.08
申请号 US201414325739 申请日期 2014.07.08
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 LEE Dae-ho;ZHO Sang-young;KIM Joon-soo
分类号 G01R33/387 主分类号 G01R33/387
代理机构 代理人
主权项 1. A magnetic resonance imaging (MRI) apparatus for measuring a magnetic field, the MRI apparatus comprising: a radio frequency (RF) transmitter configured to apply an RF pulse to an object; a gradient amplifier configured to apply test gradients having different intensities; an RF receiver configured to acquire a first echo signal and a second echo signal from a first readout gradient and acquire a third echo signal and a fourth echo signal from a second readout gradient, according to the test gradients; and an eddy current compensation processor configured to determine a characteristic value of an eddy field based on an echo time (TE) of at least one of the first through the fourth echo signals.
地址 Suwon-si KR