发明名称 Semiconductor Device with Vertical Transistor Channels and a Compensation Structure
摘要 A semiconductor device includes transistor cells with vertical channels perpendicular to a first surface of a semiconductor portion. A buried compensation structure in the semiconductor portion between the transistor cells and a second surface of the semiconductor portion parallel to the first surface includes first areas and second areas. The first and second areas are alternatingly arranged along a lateral direction parallel to the first surface. A contiguous impurity layer of a first conductivity type separates the transistor cells from the buried compensation structure.
申请公布号 US2015008517(A1) 申请公布日期 2015.01.08
申请号 US201313935628 申请日期 2013.07.05
申请人 Infineon Technologies Dresden GmbH 发明人 Mauder Anton;Kowalik-Seidl Katarzyna;Weis Rolf;Wahl Uwe
分类号 H01L29/78;H01L27/088 主分类号 H01L29/78
代理机构 代理人
主权项 1. A semiconductor device, comprising: transistor cells having vertical channels perpendicular to a first surface of a semiconductor portion; a buried compensation structure between the transistor cells and a second surface of the semiconductor portion parallel to the first surface, the compensation structure comprising first areas and second areas alternatingly arranged along a lateral direction parallel to the first surface; and a contiguous impurity layer of a first conductivity type separating the transistor cells and the compensation structure.
地址 Dresden DE