发明名称 |
Semiconductor Device with Vertical Transistor Channels and a Compensation Structure |
摘要 |
A semiconductor device includes transistor cells with vertical channels perpendicular to a first surface of a semiconductor portion. A buried compensation structure in the semiconductor portion between the transistor cells and a second surface of the semiconductor portion parallel to the first surface includes first areas and second areas. The first and second areas are alternatingly arranged along a lateral direction parallel to the first surface. A contiguous impurity layer of a first conductivity type separates the transistor cells from the buried compensation structure. |
申请公布号 |
US2015008517(A1) |
申请公布日期 |
2015.01.08 |
申请号 |
US201313935628 |
申请日期 |
2013.07.05 |
申请人 |
Infineon Technologies Dresden GmbH |
发明人 |
Mauder Anton;Kowalik-Seidl Katarzyna;Weis Rolf;Wahl Uwe |
分类号 |
H01L29/78;H01L27/088 |
主分类号 |
H01L29/78 |
代理机构 |
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代理人 |
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主权项 |
1. A semiconductor device, comprising:
transistor cells having vertical channels perpendicular to a first surface of a semiconductor portion; a buried compensation structure between the transistor cells and a second surface of the semiconductor portion parallel to the first surface, the compensation structure comprising first areas and second areas alternatingly arranged along a lateral direction parallel to the first surface; and a contiguous impurity layer of a first conductivity type separating the transistor cells and the compensation structure. |
地址 |
Dresden DE |