发明名称 SEMICONDUCTOR MEMORY DEVICE AND METHOD OF OPERATING THE SAME
摘要 A semiconductor memory device and a method of operating the same are provided. The semiconductor memory device includes memory cells stacked on a substrate. The method includes applying a reference voltage to an unselected drain select line, applying a drain selection voltage to a selected drain select line, and applying a word line voltage to a normal word line. Before the word line voltage is applied to the normal word line, a positive voltage is applied to a dummy word line to bounce the unselected drain select line.
申请公布号 US2015009758(A1) 申请公布日期 2015.01.08
申请号 US201414154839 申请日期 2014.01.14
申请人 SK hynix Inc. 发明人 JANG Yoon Soo
分类号 G11C16/24;G11C16/04 主分类号 G11C16/24
代理机构 代理人
主权项 1. A method of operating a semiconductor memory device comprising memory cells stacked on a substrate, the method comprising: applying a reference voltage to an unselected drain select line; applying a drain selection voltage to a selected drain select line; and applying a word line voltage to a normal word line, wherein, before the word line voltage is applied to the normal word line, a positive voltage is applied to a dummy word line.
地址 Icheon-si KR