发明名称 |
SEMICONDUCTOR MEMORY DEVICE AND METHOD OF OPERATING THE SAME |
摘要 |
A semiconductor memory device and a method of operating the same are provided. The semiconductor memory device includes memory cells stacked on a substrate. The method includes applying a reference voltage to an unselected drain select line, applying a drain selection voltage to a selected drain select line, and applying a word line voltage to a normal word line. Before the word line voltage is applied to the normal word line, a positive voltage is applied to a dummy word line to bounce the unselected drain select line. |
申请公布号 |
US2015009758(A1) |
申请公布日期 |
2015.01.08 |
申请号 |
US201414154839 |
申请日期 |
2014.01.14 |
申请人 |
SK hynix Inc. |
发明人 |
JANG Yoon Soo |
分类号 |
G11C16/24;G11C16/04 |
主分类号 |
G11C16/24 |
代理机构 |
|
代理人 |
|
主权项 |
1. A method of operating a semiconductor memory device comprising memory cells stacked on a substrate, the method comprising:
applying a reference voltage to an unselected drain select line; applying a drain selection voltage to a selected drain select line; and applying a word line voltage to a normal word line, wherein, before the word line voltage is applied to the normal word line, a positive voltage is applied to a dummy word line. |
地址 |
Icheon-si KR |