| 发明名称 |
SAMPLE FIXING MEMBER FOR ATOMIC FORCE MICROSCOPE |
| 摘要 |
Provided is a sample fixing member for an atomic force microscope capable of reducing the drift amount of a sample during measurement. A sample fixing member for an atomic force microscope of the present invention includes a fibrous columnar structure including a plurality of fibrous columnar objects each having a length of 200 μm or more. |
| 申请公布号 |
US2015013036(A1) |
申请公布日期 |
2015.01.08 |
| 申请号 |
US201314374733 |
申请日期 |
2013.01.29 |
| 申请人 |
NITTO DENKO CORPORATION |
发明人 |
Maeno Youhei |
| 分类号 |
G01Q30/20;G01Q60/24 |
主分类号 |
G01Q30/20 |
| 代理机构 |
|
代理人 |
|
| 主权项 |
1. A sample fixing member for an atomic force microscope, comprising a fibrous columnar structure including a plurality of fibrous columnar objects each having a length of 200 μm or more. |
| 地址 |
Ibaraki-shi, Osaka JP |
