发明名称 TESTING DEVICE, AND TESTING METHOD FOR THE LINE AND ONE SHEET USING THE TESTING DEVICE
摘要 A test device for a display device including a plurality of demultiplexing switches connected to a plurality of data lines in accordance with the present invention includes: a one-sheet test device configured to include a plurality of control switches connected to the demultiplexing switches through a plurality of wires; and a wire test device configured to transmit wire test signals for detecting defects in the wires to a pad connected to the control switches. The wire test device transmits the wire test signals to the pad to detect defects in first wires of the wires and then detect defects in remaining second wires thereof, and the first wires and the second wires are alternatively disposed below the demultiplexing switches to constitute paths for signals transmitted to the demultiplexing switches.
申请公布号 US2015008937(A1) 申请公布日期 2015.01.08
申请号 US201414190786 申请日期 2014.02.26
申请人 Samsung Display Co., Ltd. 发明人 LEE Kwang-Sae;Yoo Jeong-Geun
分类号 G01R31/02 主分类号 G01R31/02
代理机构 代理人
主权项 1. A test device for a display device, comprising: demultiplexing switches connected to data lines; a one-sheet test device comprising control switches connected to the demultiplexing switches through wires; and a wire test device configured to transmit wire test signals to a pad connected to the control switches, the test signals detecting defects in the wires, wherein: the wire test device is configured to transmit the wire test signals to the pad to detect defects in first wires of the wires, and then to detect defects in remaining second wires thereof; andthe first wires and the second wires are alternatively disposed below the demultiplexing switches and provide paths for transmitting signals to the demultiplexing switches.
地址 Yongin-city KR